1.Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China;2.School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China;3.Institute of Microelectronics Technology of Kunshan, Suzhou 215347, Jiangsu, China;4.Collaborative Research Center, Meisei University, Tokyo 191-8506, Japan
TN305
