Overview of modeling of TE in SRGM and comparisons for models
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(1. School of Computer Science and Technology, Harbin Institute of Technology, 150001 Harbin, China; 2. School of Computer Science and Technology, Harbin Institute of Technology at Weihai, 264209 Weihai, China)

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TP311

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    Abstract:

    To systematically reveal the state of art of testing effort (TE) related to software reliability growth model (SRGM) and to evaluate performances of testing effort function (TEFs), modelling of TE dependent SRGM and comparisons for models are studied in this paper. More specifically, firstly, research evolution of TE is summarized since the early 1978 s, and the relation between TE and test cost is analyzed. Then, current TEFs are reviewed and discussed, and modeling process of SRGM incorporating TE is illustrated. Performances of 8 TEFs are evaluated and compared by 4 failure data sets published. Finally, conclusions indicate that appropriate TEF can support decision for research of reliability based on SRGM and evaluating SRGM incorporating TE would be worthwhile in future.

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History
  • Received:June 03,2014
  • Revised:
  • Adopted:
  • Online: May 27,2015
  • Published:
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