Universal test system design for the spacecraft electronic system
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(1. University of Chinese Academy of Sciences, 100049 Beijing, China; 2. National Space Science Center, Chinese Academy of Sciences, 100190 Beijing, China; 3. Electrical & Computer Engineering, Boston University, 02215 Boston, USA)

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TP 274

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    Abstract:

    This paper proposes a scalable, reconfigurable, general test system design oriented the spacecraft electronic system. The design employs open flexible test system design method. Common test interfaces are integrated into classified modules with FPGA as control core, which ensures the reconfigurability of hardware. Software utilizes modularized pattern. Application program interacts with the operating system through transfer layer which ensures reusability of software. All modules can be combined into three local testing machine models using the PC/104 PLUS and Ethernet. The optical fiber transmission technology is employed to combine all the local testing machine models into a distributed testing system. This system is compatible, universal, and secure. Vacuum tank test and multi-device joint test show that the system is competent for all kinds of electronic system testing in different scenarios.

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History
  • Received:September 03,2013
  • Revised:
  • Adopted:
  • Online: September 30,2014
  • Published:
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